Author: natishadunford
Japan – Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity
Hitachi High-Tech Corporation today announced the launch of the AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope (AFM(1)/SPM(2)) equipped with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and enables measurement at atomic and molecular scales. High-Sensitivity Scanning Probe Microscope System AFM100 Pro In the field of research and development of advanced functional materials, the development of highly sensitive measurement and analysis equipment is in great demand. The AFM100 Pro meets the requirement for on-site analysis and will contribute to solving customer issues. Overview of AFM AFM is a type of ... Read more