Author: efohollie795
Japan – Hitachi High-Tech Launches the Easy-to-Use AFM100 and AFM100 Plus Atomic Force Microscopes
Hitachi High-Tech Corporation announced the launch of both AFM100 and AFM100 Plus systems – entry-level and intermediate-level models of Hitachi’s compact and versatile Atomic Force Microscopes (AFM). These tools are designed to offer ease of use and superior reliability for high-throughput R&D or quality control applications. AFM100 Plus The AFM is a type of the Scanning Probe Microscope (SPM) that scan the surface of a sample using a sharp tip typically with a radius of a few nanometers (1 nanometer = 1/1,000,000 millimeter). The AFM can provide both high-resolution visualization of surface morphology and simultaneous mapping of various other physical ... Read more