Tag: FE-SEM
Japan – Hitachi: Two New FE-SEM Models Launched to Support Data-Driven R&D
Hitachi High-Tech Corporation (“Hitachi High-Tech”) announced today the launch of two cutting-edge FE-SEM(1) models, the SU8600 and SU8700 (hereinafter, “this product line”), that feature new detectors, capabilities, advanced automation, and more. This class of instrumentation is used to observe, measure, define and analyze microstructures across a wide range of fields including semiconductors, life sciences and materials development. To be effective in such fields today, data-driven research and development requiring the acquisition of large data sets is necessary. Therefore, this product line has been designed to support the rapid acquisition of large, high-quality data sets and reduce the effort required by ... Read more